Test development and implementation for testing and characterization of NAND memory on Nextest or Advantest ATE test systems. Able to create pattern on the ATE for various command sequences of NAND interface. Develop and write automated code on ATE to control all test blocks during the collection and processing of characterization data which can run automatically to generate required PVT electrical parameters. Provide test engineering support for design debug activity and failure analysis. Perform data mining, data analysis and validate the data. Characterization of all memory technology and designs for logic/ functionality, performance, power consumption, timing and some aspects of reliability. Generating characterization data for new product design and feedback to design. Silicon micro-probing may be required. Port codes from one tester platform to another tester platform with a good understanding on limitation of respective ATE’s. Participate with a team consisting of marketing, systems, design, test, and project management to support the successful launch of new products.